XRD DATA

The XRD is utilized to determine the crystalline structure and oxidation states of the different metal oxide layers we obtained. 


For the combinatorial project a scanning XRD system from Rigaku, with a Cu Kα X-ray source (1.54060 Å) was used. 


The database includes over 2,000 XRD scans from over 100 different libraries (in each library ~13 points were scanned) each of these scans have gone through post-processing including background removal, peak detection and phase identification.


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Other Combinatorial Database: Materials and Scans

MaterialsZone Catalogue

Browse using our listings engine: by challenges / by materials / by physical measurements / by instruments.

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Optical Scans

This method is used to obtain the optical properties of the material and device libraries.

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Composition Data

The EDS detector in a high-resolution scanning electron microscope (HRSEM) was used to determine the compositions

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Band Gap

The forbidden energy gap between the valence band (VB) and the conduction band (CB) of a material.

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Current Voltage scans

In the J-V method the photocurrent is measured as a function of the photovoltage of the solar cell.

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Sheet Resistance

Sheet Resistance (SHR) is the resistance of a two-dimensional layer, for example thin film, doped semiconductor region.

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Renewable and cleantech, OLEDS, Polymers, Biomaterials, Sensors and Lithographic etc 

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Metals and alloys, Oxides, Nitrides, Salts and Organometallic 

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Measurements

DSC, E-SEM, EDS, EDXRF, Elemental and composition

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