Sheet Resistance (SHR) is the resistance of a two-dimensional layer, for example thin film, doped semiconductor region, etc. 

In the combinatorial project Electrical resistivity measurements were performed using a home-built collinear four-point probe resistance scanner system. 

The system consists of a four-point probe head, Keithley 6517B and 2400 as a voltmeter and a current supply, respectively. 

The database consists of over 200,000 sheet resistance scans from 280 libraries. Some libraries have sheet resistance measurements in different temperatures or different levels of humidity.

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Other Combinatorial Databases: Materials and Scans

MaterialsZone Catalogue

Browse using our listings engine: by challenges / by materials / by physical measurements / by instruments.

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Optical Scans

This method is used to obtain the optical properties of the material and device libraries.

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Composition Data

The EDS detector in a high-resolution scanning electron microscope (HRSEM) was used to determine the compositions

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The XRD is utilized to determine the crystalline structure and oxidation states of the different metal oxide layers we obtained.

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Current Voltage scans

In the J-V method the photocurrent is measured as a function of the photovoltage of the solar cell.

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Band gap

the forbidden energy gap between the valence band (VB) and the conduction band (CB) of a material.

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