Sheet Resistance (SHR) is the resistance of a two-dimensional layer, for example thin film, doped semiconductor region, etc.
In the combinatorial project Electrical resistivity measurements were performed using a home-built collinear four-point probe resistance scanner system.
The system consists of a four-point probe head, Keithley 6517B and 2400 as a voltmeter and a current supply, respectively.
The database consists of over 200,000 sheet resistance scans from 280 libraries. Some libraries have sheet resistance measurements in different temperatures or different levels of humidity.
Combined with machine learning using MaterialsZones large data resource further advances research and future development.
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This method is used to obtain the optical properties of the material and device libraries.
The EDS detector in a high-resolution scanning electron microscope (HRSEM) was used to determine the compositions
The XRD is utilized to determine the crystalline structure and oxidation states of the different metal oxide layers we obtained.
In the J-V method the photocurrent is measured as a function of the photovoltage of the solar cell.
the forbidden energy gap between the valence band (VB) and the conduction band (CB) of a material.