The measurement is performed using a wavelength range of 320-1000 nm, via a laser-driven light source (LDLS) xenon lamp, which is calibrated to AM1.5G. The light is irradiated on the library through two separate optical fibers (depending on the measurement) and is collected by two integrating spheres and an optical fiber.
Three measurements are performed in this system: a) total transmission (TT), measuring the light that is transmitted through the sample, b) total reflection (TR), measuring the light that is reflected from the sample, and c) specular reflection (SR), measuring the light that is reflected at a 90˚ angle from the incident light. To fully collect all the light that is transmitted and reflected, the two integrating spheres are employed.
The database includes 845,000 optical scans, each one consisting of TT, TR, and SR.
These scans were used to calculate over 800,000 absorptance plots, over 700,000 theoretical currents (Jcalc), and over 20,000 thicknesses. These scans and calculations were performed on a wide variety of material combinations, the materials shown in the plots are just the starting materials used for the different combinations.
Combined with machine learning using MaterialsZones large data resource further advances research and future development.
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In the J-V method the photocurrent is measured as a function of the photovoltage of the solar cell.
The EDS detector in a high-resolution scanning electron microscope (HRSEM) was used to determine the compositions
The XRD is utilized to determine the crystalline structure and oxidation states of the different metal oxide layers we obtained.
Sheet Resistance (SHR) is the resistance of a two-dimensional layer, for example thin film, doped semiconductor region,
The forbidden energy gap between the valence band (VB) and the conduction band (CB) of a material.
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