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This method is used to obtain the optical properties of the material and device libraries. The measurement is performed using a wavelength range of 320-1000 nm, via a laser-driven light source (LDLS) xenon lamp, which is calibrated to AM1.5G...
In the J-V method the photocurrent is measured as a function of the photovoltage of the solar cell. The cell is measured under illumination from the short circuit current (Jsc) to the open circuit voltage (Voc)...
Sheet Resistance (SHR) is the resistance of a two-dimensional layer, for example thin film, doped semiconductor region, etc. In the combinatorial project Electrical resistivity measurements were performed using a home-built collinear four-point probe resistance scanner system...
The EDS detector in a high-resolution scanning electron microscope (HRSEM) was used to determine the compositions of the elements in materials libraries as well as to see whether there were any impurities in single material libraries...
The XRD is utilized to determine the crystalline structure and oxidation states of the different metal oxide layers we obtained. For the materials science combinatorial project a scanning XRD system from Rigaku, with a Cu Kα X-ray source (1.54060 Å) was used...
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The MaterialsZone combinatorial database includes millions of measurements and can save researchers and industry both time and resources. While normally one would need to ‘start from scratch’ when studying a new material formulating which experiments to perform and how, using the MaterialsZone database one can instantly gain valuable data on multiple materials characteristics.
The database consists of two types of libraries: materials libraries, and device libraries. materials libraries consist of a continuous compositional spread of 169 binary, ternary or quaternary materials, where each material is characterized for its optical and electronic properties.
BIU combinatorial lab has multiple high throughput tools for scanning including:
Scanning Impedance Spectroscopy
Scanning Seebeck Effect
Scanning Surface Photo-Voltage, SPV spectroscopy, Kelvin Probe (*)
Scanning Electrochemical Characterization
Scanning IPCE / IPVE
Scanning Contact Angle