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Combinatorial Database of Materials and Scans

Optical Scans

This method is used to obtain the optical properties of the material and device libraries. The measurement is performed using a wavelength range of 320-1000 nm, via a laser-driven light source (LDLS) xenon lamp, which is calibrated to AM1.5G...

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Current Voltage scans

In the J-V method the photocurrent is measured as a function of the photovoltage of the solar cell. The cell is measured under illumination from the short circuit current (Jsc) to the open circuit voltage (Voc)...

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Sheet Resistance

Sheet Resistance (SHR) is the resistance of a two-dimensional layer, for example thin film, doped semiconductor region, etc. In the combinatorial project Electrical resistivity measurements were performed using a home-built collinear four-point probe resistance scanner system...

more on Sheet Resistance

Composition Data

The EDS detector in a high-resolution scanning electron microscope (HRSEM) was used to determine the compositions of the elements in materials libraries as well as to see whether there were any impurities in single material libraries...

more on Composition Data

XRD

The XRD is utilized to determine the crystalline structure and oxidation states of the different metal oxide layers we obtained. For the materials science combinatorial project a scanning XRD system from Rigaku, with a Cu Kα X-ray source (1.54060 Å) was used...

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Band gap

The forbidden energy gap between the valence band (VB) and the conduction band (CB) of a material, which needs to be overcome to produce free charge carriers...

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Challenges

Renewable and cleantech, OLEDS, Polymers, Biomaterials, Sensors and Lithographic etc 

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Materials

Metals and alloys, Oxides, Nitrides, Salts and Organometallic 

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Measurements

DSC, E-SEM, EDS, EDXRF, Elemental and composition

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Questions or Comments?

We know that each of you have their special needs for data and ai techniques. Tell us more about your project, and we will get back to you soon with some ideas of how we can support you in organizing your process and results.

SAVE TIME. SAVE MONEY

The MaterialsZone combinatorial database includes millions of measurements and can save researchers and industry both time and resources. While normally one would need to ‘start from scratch’ when studying a new material formulating which experiments to perform and how, using the MaterialsZone database one can instantly gain valuable data on multiple materials characteristics.

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COMBINATORIAL APPROACH

The database consists of two types of libraries: materials libraries, and device libraries. materials libraries consist of a continuous compositional spread of 169 binary, ternary or quaternary materials, where each material is characterized for its optical and electronic properties.

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ADDITIONAL HIGHT THROUGHPUT SCANS

BIU combinatorial lab has multiple high throughput tools for scanning including:

Scanning Profilometer  

Scanning Impedance Spectroscopy 

Scanning Seebeck Effect

Scanning Surface Photo-Voltage, SPV spectroscopy, Kelvin Probe (*)

Scanning Electrochemical Characterization

Scanning IPCE / IPVE

Scanning Raman

Scanning Contact Angle

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Call for Nano Technology Challenges

Let us know if you have any other nano technology challenges and we will supply you the data in order to accelerate your research.

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